IC Tester Using MATLAB

Authors

  • Kiruthika K Assistant Professor, Rajarajeswari College of Engineering, Ramohalli Cross, Banglore, 560074, India. Author
  • Bhumika K Ramesh UG Student, Rajarajeswari College of Engineering, Ramohalli Cross, Banglore, 560074, India. Author
  • Vishal G UG Student, Rajarajeswari College of Engineering, Ramohalli Cross, Banglore, 560074, India. Author
  • Vivek N UG Student, Rajarajeswari College of Engineering, Ramohalli Cross, Banglore, 560074, India. Author
  • Jyoti UG Student, Rajarajeswari College of Engineering, Ramohalli Cross, Banglore, 560074, India. Author

DOI:

https://doi.org/10.47392/IRJAEM.2024.0432

Keywords:

Fault detection, Microcontroller-based circuit testing, Digital IC tester

Abstract

Digital IC tester is a microcontroller grounded circuitry that tests rainfall the IC is in good working condition or bad condition. In diligence, testing of the product is a major and precious and time-consuming process. Before making the whole system work, testing is mandatorily performed to avoid crimes and uninvited results. also, in educational institutions, while performing practical it's necessary to check the ICs whether it's good or bad before performing trials. numerous a small fault at IC position makes system perform incorrectly and produce wrong labors. The proposed system gives a cheap, small, movable and easy to handle IC tester that tests the ICs belonging to introductory gate circuitry similar as mux, demux, encoder, introductory gates. A new system for the high- speed test and characterization of digital intertwined circuit prototypes has been developed. It utilizes a especially developed off- chip processor and supporting circuitry that's to be included on the prototype chip to grease the test and characterization process. The processor administers the stoner- defined test, receives and stores the test results. The test procedure and data is downloaded to the processor’s memory through a standard interface. The supporting circuitry receives the test data serially from the processor, applies it to the named circuit within the IC, collects and reformat the test results and shoot it to the processor. It also includes a high- frequence configurable timepiece creator to be used for performance characterization of the prototyped circuits.

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Published

2024-09-27